Artola, L., G. Hubert, K. M. Warren, M. Gaillardin, R. D. Schrimpf, R. A. Reed, R. A. Weller, J. R. Ahlbin, P. Paillet, M. Raine, et al.,
"SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node",
Nuclear Science, IEEE Transactions on, vol. 58, no. 3, pp. 1338 -1346, june, 2011.