Export 3 results:
"On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology",
Nuclear Science, IEEE Transactions on, vol. 59, no. 6, pp. 2748 -2755, dec., 2012.
"Double-pulse-single-event transients in combinational logic",
Reliability Physics Symposium (IRPS), 2011 IEEE International, pp. 3C.5.1 -3C.5.6, april, 2011.
"The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process",
Nuclear Science, IEEE Transactions on, vol. 57, no. 6, pp. 3380 -3385, dec., 2010.