Information Sciences Institute -

University of Southern California

Export 4 results:

2009

Amusan, O. A., L. W. Massengill, M. P. Baze, B. L. Bhuva, A. F. Witulski, J. D. Black, A. Balasubramanian, M. C. Casey, D. A. Black, J. R. Ahlbin, et al., "Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process", Device and Materials Reliability, IEEE Transactions on, vol. 9, no. 2, pp. 311 -317, june, 2009.

Casey, M. C., S. E. Armstrong, R. Arora, M. P. King, J. R. Ahlbin, S. A. Francis, B. L. Bhuva, D. McMorrow, H. L. Hughes, P. J. McMarr, et al., "Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power", Nuclear Science, IEEE Transactions on, vol. 56, no. 6, pp. 3262 -3266, dec., 2009.

2008

Ahlbin, J. R., J. D. Black, L. W. Massengill, O. A. Amusan, A. Balasubramanian, M. C. Casey, D. A. Black, M. W. McCurdy, R. A. Reed, and B. L. Bhuva, "C-CREST Technique for Combinational Logic SET Testing", Nuclear Science, IEEE Transactions on, vol. 55, no. 6, pp. 3347 -3351, dec., 2008.

Amusan, O. A., L. W. Massengill, M. P. Baze, B. L. Bhuva, A. F. Witulski, J. D. Black, A. Balasubramanian, M. C. Casey, D. A. Black, J. R. Ahlbin, et al., "Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process", Reliability Physics Symposium, 2008. IRPS 2008. IEEE International, pp. 468 -472, 27 2008-may 1.