University of Southern California

Export 5 results:
2009
Amusan, O. A., L. W. Massengill, M. P. Baze, B. L. Bhuva, A. F. Witulski, J. D. Black, A. Balasubramanian, M. C. Casey, D. A. Black, J. R. Ahlbin, et al., "Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process", Device and Materials Reliability, IEEE Transactions on, vol. 9, no. 2, pp. 311 -317, june, 2009.
2008
Ahlbin, J. R., J. D. Black, L. W. Massengill, O. A. Amusan, A. Balasubramanian, M. C. Casey, D. A. Black, M. W. McCurdy, R. A. Reed, and B. L. Bhuva, "C-CREST Technique for Combinational Logic SET Testing", Nuclear Science, IEEE Transactions on, vol. 55, no. 6, pp. 3347 -3351, dec., 2008.
Amusan, O. A., L. W. Massengill, M. P. Baze, B. L. Bhuva, A. F. Witulski, J. D. Black, A. Balasubramanian, M. C. Casey, D. A. Black, J. R. Ahlbin, et al., "Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process", Reliability Physics Symposium, 2008. IRPS 2008. IEEE International, pp. 468 -472, 27 2008-may 1.
2007
Amusan, O. A., L. W. Massengill, B. L. Bhuva, S. Dasgupta, A. F. Witulski, and J. R. Ahlbin, "Design Techniques to Reduce SET Pulse Widths in Deep-Submicron Combinational Logic", Nuclear Science, IEEE Transactions on, vol. 54, no. 6, pp. 2060 -2064, dec., 2007.
Dasgupta, S., A. F. Witulski, B. L. Bhuva, M. L. Alles, R. A. Reed, O. A. Amusan, J. R. Ahlbin, R. D. Schrimpf, and L. W. Massengill, "Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS", Nuclear Science, IEEE Transactions on, vol. 54, no. 6, pp. 2407 -2412, dec., 2007.