Information Sciences Institute -

University of Southern California

Export 4 results:

2012

Loveless, T. D., J. S. Kauppila, S. Jagannathan, D. R. Ball, J. D. Rowe, N. J. Gaspard, N. M. Atkinson, R. W. Blaine, T. R. Reece, J. R. Ahlbin, et al., "On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology", Nuclear Science, IEEE Transactions on, vol. 59, no. 6, pp. 2748 -2755, dec., 2012.

2011

Gaspard, N. J., A. F. Witulski, N. M. Atkinson, J. R. Ahlbin, W. T. Holman, B. L. Bhuva, T. D. Loveless, and L. W. Massengill, "Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS", Nuclear Science, IEEE Transactions on, vol. 58, no. 6, pp. 2614 -2620, dec., 2011.

Ahlbin, J. R., N. M. Atkinson, M. J. Gadlage, N. J. Gaspard, B. L. Bhuva, T. D. Loveless, E. X. Zhang, L. Chen, and L. W. Massengill, "Influence of N-Well Contact Area on the Pulse Width of Single-Event Transients", Nuclear Science, IEEE Transactions on, vol. 58, no. 6, pp. 2585 -2590, dec., 2011.

Ahlbin, J. R., T. D. Loveless, D. R. Ball, B. L. Bhuva, A. F. Witulski, L. W. Massengill, and M. J. Gadlage, "Double-pulse-single-event transients in combinational logic", Reliability Physics Symposium (IRPS), 2011 IEEE International, pp. 3C.5.1 -3C.5.6, april, 2011.