| Title | On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Loveless, T. D., J. S. Kauppila, S. Jagannathan, D. R. Ball, J. D. Rowe, N. J. Gaspard, N. M. Atkinson, R. W. Blaine, T. R. Reece, J. R. Ahlbin, T. D. Haeffner, M. L. Alles, W. T. Holman, B. L. Bhuva, and L. W. Massengill |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 2748 -2755 |
| Date Published | dec. |
Jonathan Ahlbin
Publication 2 of 31
Groups: