| Title | Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Gadlage, M. J., J. R. Ahlbin, B. L. Bhuva, N. C. Hooten, N. A. Dodds, R. A. Reed, L. W. Massengill, R. D. Schrimpf, and G. Vizkelethy |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 1093 -1097 |
| Date Published | june |
Jonathan Ahlbin
Publication 14 of 31
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