| Title | Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies |
| Publication Type | Conference Paper |
| Year of Publication | 2010 |
| Authors | Mahatme, N. N., I. Chatterjee, B. L. Bhuva, J. Ahlbin, L. W. Massengill, and R. Shuler |
| Conference Name | Reliability Physics Symposium (IRPS), 2010 IEEE International |
| Date Published | may |
Jonathan Ahlbin
Publication 20 of 31
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