| Title | Application of a novel test system to characterize single-event transients at cryogenic temperatures |
| Publication Type | Conference Paper |
| Year of Publication | 2009 |
| Authors | Ramachandran, V., M. J. Gadlage, J. R. Ahlbin, M. L. Alles, R. A. Reed, B. L. Bhuva, L. W. Massengill, J. D. Black, and C. N. Foster |
| Conference Name | Semiconductor Device Research Symposium, 2009. ISDRS '09. International |
| Date Published | dec. |
Jonathan Ahlbin
Publication 26 of 31
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