| Title | The effect of elevated temperature on digital single event transient pulse widths in a bulk CMOS technology |
| Publication Type | Conference Paper |
| Year of Publication | 2009 |
| Authors | Gadlage, M. J., J. R. Ahlbin, B. Narasimham, V. Ramachandran, C. A. Dinkins, B. L. Bhuva, R. D. Schrimpf, and R. L. Shuler |
| Conference Name | Reliability Physics Symposium, 2009 IEEE International |
| Date Published | april |
Jonathan Ahlbin
Publication 25 of 31
Groups: