| Title | The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process |
| Publication Type | Journal Article |
| Year of Publication | 2010 |
| Authors | Ahlbin, J. R., M. J. Gadlage, D. R. Ball, A. W. Witulski, B. L. Bhuva, R. A. Reed, G. Vizkelethy, and L. W. Massengill |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 3380 -3385 |
| Date Published | dec. |
Jonathan Ahlbin
Publication 15 of 31
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