| Title | Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Ahlbin, J. R., M. J. Gadlage, N. M. Atkinson, B. Narasimham, B. L. Bhuva, A. F. Witulski, W. T. Holman, P. H. Eaton, and L. W. Massengill |
| Journal | Device and Materials Reliability, IEEE Transactions on |
| Pages | 401 -406 |
| Date Published | sept. |
Jonathan Ahlbin
Publication 7 of 31
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