| Title | Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Atkinson, N. M., J. R. Ahlbin, A. F. Witulski, N. J. Gaspard, W. T. Holman, B. L. Bhuva, E. X. Zhang, L. Chen, and L. W. Massengill |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 2578 -2584 |
| Date Published | dec. |
Jonathan Ahlbin
Publication 7 of 31
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