| Title | Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Gaspard, N. J., A. F. Witulski, N. M. Atkinson, J. R. Ahlbin, W. T. Holman, B. L. Bhuva, T. D. Loveless, and L. W. Massengill |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 2614 -2620 |
| Date Published | dec. |
Jonathan Ahlbin
Publication 8 of 31
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