| Title | Increased Single-Event Transient Pulsewidths in a 90-nm Bulk CMOS Technology Operating at Elevated Temperatures |
| Publication Type | Journal Article |
| Year of Publication | 2010 |
| Authors | Gadlage, M. J., J. R. Ahlbin, B. Narasimham, V. Ramachandran, C. A. Dinkins, N. D. Pate, B. L. Bhuva, R. D. Schrimpf, L. W. Massengill, R. L. Shuler, and D. McMorrow |
| Journal | Device and Materials Reliability, IEEE Transactions on |
| Pages | 157 -163 |
| Date Published | march |
Jonathan Ahlbin
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