| Title | Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process |
| Publication Type | Journal Article |
| Year of Publication | 2009 |
| Authors | Amusan, O. A., L. W. Massengill, M. P. Baze, B. L. Bhuva, A. F. Witulski, J. D. Black, A. Balasubramanian, M. C. Casey, D. A. Black, J. R. Ahlbin, R. A. Reed, and M. W. McCurdy |
| Journal | Device and Materials Reliability, IEEE Transactions on |
| Pages | 311 -317 |
| Date Published | june |
Jonathan Ahlbin
Publication 24 of 31
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