| Title | Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process |
| Publication Type | Conference Paper |
| Year of Publication | 2008 |
| Authors | Amusan, O. A., L. W. Massengill, M. P. Baze, B. L. Bhuva, A. F. Witulski, J. D. Black, A. Balasubramanian, M. C. Casey, D. A. Black, J. R. Ahlbin, R. A. Reed, and M. W. McCurdy |
| Conference Name | Reliability Physics Symposium, 2008. IRPS 2008. IEEE International |
| Date Published | 27 2008-may 1 |
Jonathan Ahlbin
Publication 28 of 31
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