| Title | Radiation Effects in 3D Integrated SOI SRAM Circuits |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Gouker, P. M., B. Tyrrell, R. D'Onofrio, P. Wyatt, T. Soares, W. Hu, C. Chen, J. R. Schwank, M. R. Shaneyfelt, E. W. Blackmore, K. Delikat, M. Nelson, P. McMarr, H. Hughes, J. R. Ahlbin, S. Weeden-Wright, and R. Schrimpf |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 2845 -2854 |
| Date Published | dec. |
Jonathan Ahlbin
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