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TitleScaling Trends in SET Pulse Widths in Sub-100 nm Bulk CMOS Processes
Publication TypeJournal Article
Year of Publication2010
AuthorsGadlage, M. J., J. R. Ahlbin, B. Narasimham, B. L. Bhuva, L. W. Massengill, R. A. Reed, R. D. Schrimpf, and G. Vizkelethy
JournalNuclear Science, IEEE Transactions on
Pages3336 -3341
Date Publisheddec.
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