| Title | SET Characterization in Logic Circuits Fabricated in a 3DIC Technology |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Gouker, P. M., B. Tyrrell, M. Renzi, C. Chen, P. Wyatt, J. R. Ahlbin, S. Weeden-Wright, N. M. Atkinson, N. J. Gaspard, B. L. Bhuva, L. W. Massengill, E. Zhang, R. Schrimpf, R. A. Weller, M. P. King, and M. J. Gadlage |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 2555 -2562 |
| Date Published | dec. |
Jonathan Ahlbin
Publication 12 of 31
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