| Title | SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Artola, L., G. Hubert, K. M. Warren, M. Gaillardin, R. D. Schrimpf, R. A. Reed, R. A. Weller, J. R. Ahlbin, P. Paillet, M. Raine, S. Girard, S. Duzellier, L. W. Massengill, and F. Bezerra |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 1338 -1346 |
| Date Published | june |
Jonathan Ahlbin
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