| Title | Single-Event Transient Measurements in nMOS and pMOS Transistors in a 65-nm Bulk CMOS Technology at Elevated Temperatures |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Gadlage, M. J., J. R. Ahlbin, B. Narasimham, B. L. Bhuva, L. W. Massengill, and R. D. Schrimpf |
| Journal | Device and Materials Reliability, IEEE Transactions on |
| Pages | 179 -186 |
| Date Published | march |
Jonathan Ahlbin
Publication 11 of 31
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