| Title | Single event transient pulse width measurements in a 65-nm bulk CMOS technology at elevated temperatures |
| Publication Type | Conference Paper |
| Year of Publication | 2010 |
| Authors | Gadlage, M. J., J. R. Ahlbin, B. L. Bhuva, L. W. Massengill, and R. D. Schrimpf |
| Conference Name | Reliability Physics Symposium (IRPS), 2010 IEEE International |
| Date Published | may |
Jonathan Ahlbin
Publication 18 of 31
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