| Title | Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies |
| Publication Type | Journal Article |
| Year of Publication | 2009 |
| Authors | Gadlage, M. J., J. R. Ahlbin, V. Ramachandran, P. Gouker, C. A. Dinkins, B. L. Bhuva, B. Narasimham, R. D. Schrimpf, M. W. McCurdy, M. L. Alles, R. A. Reed, M. H. Mendenhall, L. W. Massengill, R. L. Shuler, and D. McMorrow |
| Journal | Nuclear Science, IEEE Transactions on |
| Pages | 3115 -3121 |
| Date Published | dec. |
Jonathan Ahlbin
Publication 27 of 31
Groups: