| Title | On-line characterization and reconfiguration for single event upset variations |
| Publication Type | Conference Paper |
| Year of Publication | 2009 |
| Authors | Zick, K. M., and J. P. Hayes |
| Conference Name | On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International |
| Conference Location | Sesimbra, Portugal |
Kenneth M. Zick
Publication 9 of 10
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