| Title | Self-Test and Adaptation for Random Variations in Reliability |
| Publication Type | Conference Paper |
| Year of Publication | 2010 |
| Authors | Zick, K. M., and J. P. Hayes |
| Conference Name | Field Programmable Logic and Applications (FPL), 2010 International Conference on |
| Date Published | 31 2010-sept. 2 |
| Conference Location | Milan, Italy |


