University of Southern California

Publications

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AH
High-level vulnerability over space and time to insidious soft errorsZick, Kenneth M., Hayes, John P.
In High Level Design Validation and Test Workshop, 2008. HLDVT '08. IEEE International
2008, 161 -168 pagesBibTex
LO
On-line characterization and reconfiguration for single event upset variationsZick, Kenneth M., Hayes, John P.
In On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
2009, 243 -248 pagesBibTex
On-line sensing for healthier FPGA systemsZick, Kenneth M., Hayes, John P.
In Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays
2010, 239–248 pages
http://www.isi.edu/people/kzick/access_papersBibTex
RS
Self-Test and Adaptation for Random Variations in ReliabilityZick, Kenneth M., Hayes, John P.
In Field Programmable Logic and Applications (FPL), 2010 International Conference on
2010, 193 -198 pagesBibTex
T
Toward Physically-Adaptive ComputingZick, Kenneth M., Hayes, John P.
In Proceedings of the 2010 Fourth IEEE International Conference on Self-Adaptive and Self-Organizing Systems
2010, 124–133 pages
http://dx.doi.org/10.1109/SASO.2010.13BibTex
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