Export 6 results:
K. M. Zick, S. Li, and M. C. French, "High-precision self-characterization for the LUT burn-in information leakage threat", Field Programmable Logic and Applications (FPL), 2014 24th International Conference on: IEEE, pp. 1–6, 2014.
J. P. Walters, K. M. Zick, and M. C. French, "A practical characterization of a NASA SpaceCube application through fault emulation and laser testing", Dependable Systems and Networks (DSN), 2013 43rd Annual IEEE/IFIP International Conference on: IEEE, pp. 1–8, 2013.
K. M. Zick, M. Srivastav, W. Zhang, and M. C. French, "Sensing nanosecond-scale voltage attacks and natural transients in fpgas", Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays: ACM, pp. 101–104, 2013.