Publications

Export 20 results:
2015
2014
K. M. Zick, S. Li, and M. French, "High-precision self-characterization for the LUT burn-in information leakage threat", International Conference on Field Programmable Logic and Applications (FPL) (Acceptance ratio: 22%), 09/2014.
K. M. Zick, S. Li, and M. C. French, "High-precision self-characterization for the LUT burn-in information leakage threat", Field Programmable Logic and Applications (FPL), 2014 24th International Conference on: IEEE, pp. 1–6, 2014.
2013
K. M. Zick, M. Srivastav, W. Zhang, and M. French, "Sensing Nanosecond-scale Voltage Attacks and Natural Transients in FPGAs", ACM/SIGDA International Symposium on Field Programmable Gate Arrays, 02/2013.
J. P. Walters, K. M. Zick, and M. French, "A Practical Characterization of a NASA SpaceCube Application through Fault Emulation and Laser Testing", IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 06/2013 (to appear), 2013.
J. P. Walters, K. M. Zick, and M. C. French, "A practical characterization of a NASA SpaceCube application through fault emulation and laser testing", Dependable Systems and Networks (DSN), 2013 43rd Annual IEEE/IFIP International Conference on: IEEE, pp. 1–8, 2013.
K. M. Zick, M. Srivastav, W. Zhang, and M. C. French, "Sensing nanosecond-scale voltage attacks and natural transients in fpgas", Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays: ACM, pp. 101–104, 2013.
2012
2011
2010
K. M. Zick, and J. P. Hayes, "Self-Test and Adaptation for Random Variations in Reliability", Field Programmable Logic and Applications (FPL), 2010 International Conference on, Milan, Italy, pp. 193 -198, 31 2010-sept. 2.
K. M. Zick, and J. P. Hayes, "On-line sensing for healthier FPGA systems", Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays, New York, NY, USA, ACM, pp. 239–248, 2010.
K. M. Zick, and J. P. Hayes, "Toward Physically-Adaptive Computing", Proceedings of the 2010 Fourth IEEE International Conference on Self-Adaptive and Self-Organizing Systems, Budapest, Hungary, IEEE Computer Society, pp. 124–133, 2010.
2009
K. M. Zick, and J. P. Hayes, "On-line characterization and reconfiguration for single event upset variations", On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International, Sesimbra, Portugal, pp. 243 -248, 2009.
2008
K. M. Zick, and J. P. Hayes, "High-level vulnerability over space and time to insidious soft errors", High Level Design Validation and Test Workshop, 2008. HLDVT '08. IEEE International, pp. 161 -168, 11/2008.