{"id":75,"date":"2021-11-02T19:02:02","date_gmt":"2021-11-02T19:02:02","guid":{"rendered":"https:\/\/www.isi.edu\/centers-sure\/?page_id=75"},"modified":"2024-08-12T14:55:56","modified_gmt":"2024-08-12T14:55:56","slug":"selected-publications","status":"publish","type":"page","link":"https:\/\/www.isi.edu\/centers-sure\/research\/selected-publications\/","title":{"rendered":"Selected Publications"},"content":{"rendered":"\n\n<strong>Please note that we are in the process of adding additional publications from 2016 to the present day.<\/strong>\nFollowing is a sampling of recent publications &#8211; spanning security, trust, reliance and reliability &#8211; by SURE researchers.\n\n\t<a onclick=\"topFunction()\" id=\"toTop\" aria-label=\"Go to top\">\n<\/a>\n    <label for=\"publications\"><strong>View publications from<\/strong><\/label>\n    <select name=\"publications\" id=\"publications\" onchange=\"selectYear()\">\n        <option value=\"2015\">2015<\/option>\n        <option value=\"2014\">2014<\/option>\n        <option value=\"2013\">2013<\/option>\n        <option value=\"2011\">2011<\/option>\n        <option value=\"2010\">2010<\/option>\n    <\/select>\n        <p>I. S. Esqueda and C. D. Cress, &#8220;Modeling Radiation-Induced Scattering in Graphene,&#8221; IEEE Trans. Nucl. Sci., in press, 2015.<\/p>\n        <p>I. S. Esqueda, H. J. Barnaby, M. P. King, &#8220;Compact modeling of total ionizing dose and aging effects in MOS technologies,&#8221; IEEE Trans. Nucl. Sci., vol. 62, No. 4, pp. 1501-1515, 2015.<\/p>\n        <p>I. S. Esqueda, C. D. Cress, Y. Cao, Y. Che and C. Zhou, &#8220;The impact of defect scattering on the quasi-Ballistic transport of nanoscale conductors,&#8221; Journal of Applied Physics, 117, 084319, 2015.<\/p>\n        <p>I. S. Esqueda, &#8220;The impact of stress-induced defects on MOS electrostatics and short-channel effects,&#8221; Journal of Solid State Electronics, 103, pp. 167-172, 2015.<\/p>\n        <p>Zick, Kenneth M., Li, S., French, M., &#8220;High-precision self-characterization for the LUT burn-in information leakage threat,&#8221; In International Conference on Field Programmable Logic and Applications (FPL), 2014.<\/p>\n        <p>K. Zick, F. Spedalieri and M. French, &#8220;Physical Variations and the Promise of Adaptive Embedding,&#8221; poster, Adiabatic Quantum Computing Workshop, June 2014.<\/p>\n        <p>A Power Efficient Reconfigurable System-in-Stack: 3D Integration of Accelerators, FPGAs, and DRAM,&#8221; Peter Gadfort, Aravind Dasu, Ali Akoglu, Yoon Kah Leow, and Michael Fritze. System-on-Chip Conference (SOCC), 2014 27th IEEE International, vol., no., pp.11,16, 2-5 Sept. 2014.<\/p>\n        <p>Y. Pino, V. Jyothi, and M. French, &#8220;Intra-Die Process Variation Aware Anomaly Detection in FPGAs&#8221;, International Test Conference (ITC), Seattle, WA, Oct 21 &#8211; 23 2014.<\/p>\n        <p>I. S. Esqueda, C. D. Cress, Y. Che, Y. Cao and C. Zhou, &#8220;Charge trapping in aligned single-walled carbon nanotube arrays induced by ionizing radiation exposure,&#8221; Journal of Applied Physics, 115, 054506, 2014.<\/p>\n        <p>I. S. Esqueda and H. J. Barnaby, &#8220;A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits,&#8221; Journal of Solid State Electronics , 91, pp. 81-86, 2014.<\/p>\n        <p>Walters, J.P., Zick, K.M., French, M., &#8220;A Practical Characterization of a NASA SpaceCube Application through Fault Emulation and Laser Testing,&#8221; In IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN), 2013.<\/p>\n        <p>F. Kashfi and J. Draper, &#8220;Multiobjective Optimization of Cost, Performance and Thermal Reliability in 3DICs,&#8221; in 2013 Euromicro Conference on Digital System Design (DSD) , 2013, pp. 404-411<\/p>\n        <p>G. Neela and J. Draper, &#8220;Logic-on-logic partitioning techniques for 3-dimensional integrated circuits,&#8221; in Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS) , 2013, pp. 789-792<\/p>\n        <p>R. Soni, N. Steiner, M. French, &#8220;Open-Source Bitstream Generation,&#8221; IEEE Field Programmable Custom Computing Machines, Seattle, WA, April 2013.<\/p>\n        <p>K. Zick, M. Srivastav, W. Zhang, M. French, &#8220;Sensing FPGA Voltage Transients and Protecting Against Power Supply-Related Attacks,&#8221; ACM International Symposium on FPGAs, Monterey CA, 2013.<\/p>\n        <p>A. Schmidt, B. Huang, R. Sass, and M. French, &#8220;Checkpoint\/Restart and Beyond: Resilient High Performance Computing with FPGAs,&#8221; IEEE Field Programmable Custom Computing Machines, Salt Lake City, UT, May 2011.<\/p>\n        <p>N. Steiner, A. Wood, H. Shojaei, J. Couch, P. Athanas, M. French, &#8220;Torc: Tools for Open Reconfigurable Computing,&#8221; 19th ACM\/SIGDA International Symposium on Field-Programmable Gate Arrays, February, 2011.<\/p>\n        <p>A. Schmidt, W. Kritikos, R. Sass, E. Anderson, and M. French, &#8220;Merging Programming Moldels and On-chip Networks to Meet the Programmable and Performance Needs of Multi-Core Systems on a Programmable Chip,&#8221; IEEE International Conference on ReConFigurable Computing and FPGAs, Cancun, Mexico, December 2010. <strong>BEST PAPER AWARD<\/strong><\/p>\n        <p>Mahta Haghi and Jeff Draper, A Single-Event Upset Hardening Technique for High Speed MOS Current Mode Logic, Proceedings of the IEEE International Symposium on Circuits and Systems, June 2010.<\/p>\n        <p>Young Hoon Kang, Taek-Jun Kwon, Jeff Draper, Fault-Tolerant Flow Control in On-Chip Networks, Proceedings of the 4th ACM\/IEEE International Symposium on Networks-on-Chip, May 2010<\/p>\n\n","protected":false},"excerpt":{"rendered":"<p>Please note that we are in the process of adding additional publications from 2016 to the present day. Following is a sampling of recent publications &#8211; spanning security, trust, reliance and reliability &#8211; by SURE researchers. View publications from 20152014201320112010 I. S. Esqueda and C. D. Cress, &#8220;Modeling Radiation-Induced Scattering in Graphene,&#8221; IEEE Trans. Nucl.&hellip;<\/p>\n","protected":false},"author":421,"featured_media":0,"parent":47,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"news_source":"","news_author":"","external_news_link":"","footnotes":""},"class_list":["post-75","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.2 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Selected Publications - Secure and Robust Electronics Center<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.isi.edu\/centers-sure\/research\/selected-publications\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Selected Publications - Secure and Robust Electronics Center\" \/>\n<meta property=\"og:description\" content=\"Please note that we are in the process of adding additional publications from 2016 to the present day. 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