Matthew French

High-precision self-characterization for the LUT burn-in information leakage threat

TitleHigh-precision self-characterization for the LUT burn-in information leakage threat
Publication TypeConference Paper
Year of Publication2014
AuthorsK. M. Zick, S. Li, and M. C. French
Conference NameField Programmable Logic and Applications (FPL), 2014 24th International Conference on
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