Matthew French

IRIS (Integrity and Reliability in Integrated Circuits) Test Article Generation (ITAG)

TitleIRIS (Integrity and Reliability in Integrated Circuits) Test Article Generation (ITAG)
Publication TypeTechnical Report
Year of Publication2015
AuthorsJ. Draper, and M. C. French
InstitutionUNIVERSITY OF SOUTHERN CALIFORNIA LOS ANGELES
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