The Comprehensive Independent Functional Testing tools (CIFT) is researching algorithmic generation of independent functional tests that can be used to cross-check the FPGA manufacturer’s testing and in field testing for counterfeit, damaged, or aging parts.  Functional testing of commercial FPGAs, independent of in-house FPGA vendor production testing, is an important first step in establishing a trusted supply-chain, determining the usability of devices stored in inventory for long periods of time, verifying complex 2.5D and 3D packages, and determining the health status of fielded systems. Independent functional testing of the FPGA VLSI provides an open, transparent check that the device is in fact the device it claims to be and is in good working order. This is no trivial feat as modern FPGA devices now contain over 10B transistors, over a dozen types of Hard IP, 35M user wires, and 380M user routing switches.

CIFT tests include detection of stuck at faults in CLB/LAB/PLB resources, embedded block RAMs, configuration memory, and routing interconnect paths in FPGAs in over 14 device families including devices from AMD/Xilinx, Intel, Microsemi, and Lattice.  CIFT manages the automated creation of test bitstreams, the programming and running of test on hardware, and the extraction and collection of status of the hardware.  Further CIFT work is looking into addressing additional device fault models including measuring the parametric delay throughout a device.