Abstract

Today's CMOS technologies allow larger circuit designs to fit on a single chip. However, this advantage comes at a high price of increased process-voltage-temperature (PVT) variations. FPGAs and their designs are no exceptions to such variations. In fact, the same bit file loaded into two different FPGAs of the same model can produce a significant difference in power and thermal characteristics due to variations that exist within the chip. Since it is increasingly difficult to control physical variations through manufacturing tasks, there is a need for practical ways to sense chip variations to provide a way for circuit designers to compensate or avoid its negative effects. One of the most critical aspects of such variation is power. Therefore, we developed and demonstrated a high accuracy on-chip on-line Energy-per-Component (EPC) measurement technology on Xilinx FPGAs since 2011. However, we found that the …

Date

2017

Authors

Young H Cho, Siddharth S Bhargav

Conference

2017 International Conference on ReConFigurable Computing and FPGAs (ReConFig)

Pages

1-6

Publisher

IEEE