Export 3 results:
"The Significance of High-Level Carrier Generation Conditions for Charge Collection in Irradiated Devices",
Nuclear Science, IEEE Transactions on, vol. 59, no. 6, pp. 2710 -2721, dec., 2012.
"SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node",
Nuclear Science, IEEE Transactions on, vol. 58, no. 3, pp. 1338 -1346, june, 2011.
"SET Characterization in Logic Circuits Fabricated in a 3DIC Technology",
Nuclear Science, IEEE Transactions on, vol. 58, no. 6, pp. 2555 -2562, dec., 2011.