Gaspard, N. J., J. R. Ahlbin, P. M. Gouker, N. M. Atkinson, M. J. Gadlage, A. F. Witulski, W. T. Holman, B. L. Bhuva, E. X. Zhang, and L. W. Massengill,
"Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI",
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on, pp. 252 -255, sept., 2011.
Gouker, P. M., B. Tyrrell, R. D'Onofrio, P. Wyatt, T. Soares, W. Hu, C. Chen, J. R. Schwank, M. R. Shaneyfelt, E. W. Blackmore, et al.,
"Radiation Effects in 3D Integrated SOI SRAM Circuits",
Nuclear Science, IEEE Transactions on, vol. 58, no. 6, pp. 2845 -2854, dec., 2011.
Gouker, P. M., B. Tyrrell, M. Renzi, C. Chen, P. Wyatt, J. R. Ahlbin, S. Weeden-Wright, N. M. Atkinson, N. J. Gaspard, B. L. Bhuva, et al.,
"SET Characterization in Logic Circuits Fabricated in a 3DIC Technology",
Nuclear Science, IEEE Transactions on, vol. 58, no. 6, pp. 2555 -2562, dec., 2011.