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University of Southern California

Export 1 results:

2010

Ahlbin, J. R., M. J. Gadlage, D. R. Ball, A. W. Witulski, B. L. Bhuva, R. A. Reed, G. Vizkelethy, and L. W. Massengill, "The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process", Nuclear Science, IEEE Transactions on, vol. 57, no. 6, pp. 3380 -3385, dec., 2010.