Information Sciences Institute -

University of Southern California

Export 2 results:

2012

Loveless, T. D., J. S. Kauppila, S. Jagannathan, D. R. Ball, J. D. Rowe, N. J. Gaspard, N. M. Atkinson, R. W. Blaine, T. R. Reece, J. R. Ahlbin, et al., "On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology", Nuclear Science, IEEE Transactions on, vol. 59, no. 6, pp. 2748 -2755, dec., 2012.

2010

Jagannathan, S., M. J. Gadlage, B. L. Bhuva, R. D. Schrimpf, B. Narasimham, J. Chetia, J. R. Ahlbin, and L. W. Massengill, "Independent Measurement of SET Pulse Widths From N-Hits and P-Hits in 65-nm CMOS", Nuclear Science, IEEE Transactions on, vol. 57, no. 6, pp. 3386 -3391, dec., 2010.