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2010

Mahatme, N. N., I. Chatterjee, B. L. Bhuva, J. Ahlbin, L. W. Massengill, and R. Shuler, "Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies", Reliability Physics Symposium (IRPS), 2010 IEEE International, pp. 1031 -1035, may, 2010.