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University of Southern California

Export 1 results:

2012

Loveless, T. D., J. S. Kauppila, S. Jagannathan, D. R. Ball, J. D. Rowe, N. J. Gaspard, N. M. Atkinson, R. W. Blaine, T. R. Reece, J. R. Ahlbin, et al., "On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology", Nuclear Science, IEEE Transactions on, vol. 59, no. 6, pp. 2748 -2755, dec., 2012.