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University of Southern California

Export 1 results:

2010

Gadlage, M. J., J. R. Ahlbin, B. Narasimham, V. Ramachandran, C. A. Dinkins, N. D. Pate, B. L. Bhuva, R. D. Schrimpf, L. W. Massengill, R. L. Shuler, et al., "Increased Single-Event Transient Pulsewidths in a 90-nm Bulk CMOS Technology Operating at Elevated Temperatures", Device and Materials Reliability, IEEE Transactions on, vol. 10, no. 1, pp. 157 -163, march, 2010.