Information Sciences Institute -

University of Southern California

Export 1 results:

2009

Ramachandran, V., M. J. Gadlage, J. R. Ahlbin, M. L. Alles, R. A. Reed, B. L. Bhuva, L. W. Massengill, J. D. Black, and C. N. Foster, "Application of a novel test system to characterize single-event transients at cryogenic temperatures", Semiconductor Device Research Symposium, 2009. ISDRS '09. International, pp. 1 -2, dec., 2009.