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2012

Hooten, N. C., L. D. Edmonds, W. G. Bennett, J. R. Ahlbin, N. A. Dodds, R. A. Reed, R. D. Schrimpf, and R. A. Weller, "The Significance of High-Level Carrier Generation Conditions for Charge Collection in Irradiated Devices", Nuclear Science, IEEE Transactions on, vol. 59, no. 6, pp. 2710 -2721, dec., 2012.