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2013
Zick, K. M.
,
M. Srivastav
,
W. Zhang
, and
M. French
,
"
Sensing Nanosecond-scale Voltage Attacks and Natural Transients in FPGAs
",
ACM/SIGDA International Symposium on Field Programmable Gate Arrays
, 02/2013.
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Walters, J. P.
,
K. M. Zick
, and
M. French
,
"
A Practical Characterization of a NASA SpaceCube Application through Fault Emulation and Laser Testing
",
IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
, 06/2013 (to appear), 2013.
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2012
Zick, K. M.
,
C. - C. Yu
,
J. P. Walters
, and
M. C. French
,
"
Silent Data Corruption and Embedded Processing with NASA’s SpaceCube
",
IEEE Embedded Systems Letters, vol. 4, no. 2
, no. 2, vol. vol. 4, pp. 33-36, 06/2012.
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Zick, K. M.
, and
J. P. Hayes
,
"
Low-Cost Sensing with Ring Oscillator Arrays for Healthier Reconfigurable Systems
",
ACM Transactions on Reconfigurable Technology and Systems (TRETS), vol. 5, no. 1
, 03/2012.
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2011
Walters, J. P.
,
K. M. Zick
, and
M. C. French
,
"
Radiation Hardening of FPGA-embedded CPUs via Software, Validated with Fault Emulation
",
ReSpace/MAPLD
, Albuquerque, NM, 08/2011.
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2010
Zick, K. M.
, and
J. P. Hayes
,
"
Self-Test and Adaptation for Random Variations in Reliability
",
Field Programmable Logic and Applications (FPL), 2010 International Conference on
, Milan, Italy, pp. 193 -198, 31 2010-sept. 2.
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Zick, K. M.
, and
J. P. Hayes
,
"
On-line sensing for healthier FPGA systems
",
Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays
, New York, NY, USA, ACM, pp. 239–248, 2010.
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Zick, K. M.
, and
J. P. Hayes
,
"
Toward Physically-Adaptive Computing
",
Proceedings of the 2010 Fourth IEEE International Conference on Self-Adaptive and Self-Organizing Systems
, Budapest, Hungary, IEEE Computer Society, pp. 124–133, 2010.
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2009
Zick, K. M.
, and
J. P. Hayes
,
"
On-line characterization and reconfiguration for single event upset variations
",
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
, Sesimbra, Portugal, pp. 243 -248, 2009.
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2008
Zick, K. M.
, and
J. P. Hayes
,
"
High-level vulnerability over space and time to insidious soft errors
",
High Level Design Validation and Test Workshop, 2008. HLDVT '08. IEEE International
, pp. 161 -168, 11/2008.
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