Publications

Method of fabricating least defective non-planar bipolar heterostructure transistors

Abstract

A method for fabricating low defective non-planar bipolar heterostructure transistors includes a steps of providing a substrate that is coated with a first dielectric layer when the substrate is not composed of a dielectric material. A layer of a first semiconductor material is formed by template liquid phase (TLP) crystal growth wherein a second dielectric layer is disposed over the first semiconductor material. A trench is patterned into the second dielectric layer. An intermediate heterostructure is formed by epitaxially growing second semiconductor material in the trench to form a fin structure therein. Various power transistor structures can be formed from the intermediate heterostructure.

Date
2024
Authors
AP Jacob, RR Kapadia
Inventors
Ajey Poovannummoottil Jacob, Rehan Rashid Kapadia
Patent_office
US
Application_number
18579330