Publications

Stacked elongated nanoshapes of different semiconductor materials and structures that incorporate the nanoshapes

Abstract

Provided by IMEC, APA citation:" World's first vertically stacked gate-all-around Si nanowire CMOS transistors”(Dec. 23, 2016) retrieved Jun. 14, 2017 from https://phys. org/news/2016-12-world vertically-stacked-gateall-around-si. html, pp. 1-2.(Continued)(73) Assignee: GLOBALFOUNDRIES INC., Grand Cayman (KY)

Date
2019
Authors
BJ Pawlak, G Bouche, AP Jacob
Inventors
Bartlomiej J Pawlak, Guillaume Bouche, Ajey P Jacob
Patent_office
US
Patent_number
10453750
Application_number
15629884