Publications

Methods of forming fins for a FinFET device by forming and replacing sacrificial fin structures with alternative materials

Abstract

One illustrative method disclosed herein includes, among other things, forming a sacrificial fin structure above a semiconductor Substrate, forming a layer of insulating mate rial around the sacrificial fin structure, removing the sacri ficial fin structure so as to define a replacement fin cavity in the layer of insulating material that exposes an upper Surface of the Substrate, forming a replacement fin in the replace ment fin cavity on the exposed upper Surface of the Sub strate, recessing the layer of insulating material, and forming a gate structure around at least a portion of the replacement fin exposed above the recessed layer of insulating material.

Date
2017
Authors
MK Akarvardar, AP Jacob
Inventors
Murat Kerem Akarvardar, Ajey Poovannummoottil Jacob
Patent_office
US
Patent_number
9590040
Application_number
14341000