Publications

Uniaxially-strained fd-soi finfet

Abstract

Methods and structures for forming uniaxially-strained, nanoscale, semiconductor bars from a biaxially-strained semiconductor layer are described. A spatially-doubled man drel process may be used to form a mask for patterning dense, narrow trenches through the biaxially-strained semiconduc tor layer. The resulting slicing of the biaxially-strained layer enhances carrier mobility and can increase device perfor aCC.

Date
February 2, 2016
Authors
P Morin, M Vinet, L Grenouillet, AP Jacob
Inventors
Pierre Morin, Maud Vinet, Laurent Grenouillet, Ajey Poovannummoottil Jacob
Patent_office
US
Patent_number
9252208
Application_number
14447678