Publications
Uniaxially-strained fd-soi finfet
Abstract
Methods and structures for forming uniaxially-strained, nanoscale, semiconductor bars from a biaxially-strained semiconductor layer are described. A spatially-doubled man drel process may be used to form a mask for patterning dense, narrow trenches through the biaxially-strained semiconduc tor layer. The resulting slicing of the biaxially-strained layer enhances carrier mobility and can increase device perfor aCC.
- Date
- February 2, 2016
- Authors
- P Morin, M Vinet, L Grenouillet, AP Jacob
- Inventors
- Pierre Morin, Maud Vinet, Laurent Grenouillet, Ajey Poovannummoottil Jacob
- Patent_office
- US
- Patent_number
- 9252208
- Application_number
- 14447678