Abstract

G06V10/443—Local feature extraction by analysis of parts of the pattern, eg by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, eg of connected components by matching or filtering

Date

October 3, 2023

Authors

A Jaiswal, Y Wu, P Natarajan, P Natarajan

Inventors

Ayush Jaiswal, Yue Wu, Pradeep Natarajan, Premkumar Natarajan

Patent_office

US

Patent_number

11775617

Application_number

17201358