Abstract

∎ Objectives:
□ Mitigate both temporary (SEU) and permanent (TID) faults□ Mitigate faults with minimum (or no) VLSI architecture modification□ The FT algorithms are

Date

2006

Authors

Karandeep Singh, D Agbaria, I Kang, MC French, VA Arlington

Journal

9th Annual International Conference on Military and Aerospace Programmable Logic Devices

Publisher

NASA