Abstract

As commercial market forces are driving Integrated Circuit IC foundries offshore, the U.S. government is increasingly becoming concerned with the integrity of electronics procured from such offshore, uncontrolled facilities. Similarly, the government is intensely interested in the useful lifespan of these components. DARPAs Microelectronics Technology Office established the Integrity and Reliability in Integrated Circuits IRIS program to investigate methods of validating the functionality and reliability of ICs to address this issue. The Information Sciences Institute of the University of Southern California USCISI proposed to aid the government in performing research in this area by supplying benchmark Test Articles TAs to better focus and drive the results of the IRIS program. USCISI has the unique blend of skills, IP, and resources, to not only develop and support each test article, but to do so in a cost-effective manner on State-of-the-Art SoA process technologies.

Date

2015

Authors

Jeffrey Draper, Matthew French